DocumentCode
615118
Title
A unified probabilistic framework for measuring the intensity of spontaneous facial action units
Author
Yongqiang Li ; Mavadati, S. Mohammad ; Mahoor, M.H. ; Qiang Ji
Author_Institution
Dept. of Electr., Comput., & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2013
fDate
22-26 April 2013
Firstpage
1
Lastpage
7
Abstract
Automatic facial expression analysis has received great attention in both academia and industry in the past two decades. Facial action coding system, which describes all possible facial expressions based on a set of anatomical facial muscle movements, called Action Unit (AU), is the most popularly used descriptive approach for analyzing facial expressions. In majority of the existing studies in the area of facial expression recognition, the focus has mostly been on facial action unit detection or basic facial expression recognition and there have been very few works on investigating the measuring the intensity of spontaneous facial actions. In addition, these works try to measure the intensity of facial actions statically and individually, ignoring the dependence among AUs, as well as the temporal information, which is crucial for analyzing spontaneous expression. To overcome this problem, this paper proposes a framework based on Dynamic Bayesian Network (DBN) to systematically model such relationships among spontaneous AUs for measuring their intensities. Our experimental results show improvement over image-driven methods alone in AU intensity measurement.
Keywords
Bayes methods; face recognition; image coding; DBN; anatomical facial muscle movements; automatic facial expression analysis; dynamic Bayesian network; facial action coding system; image-driven methods; spontaneous facial action units; unified probabilistic framework; Databases; Face recognition; Feature extraction; Gold; Manifolds; Support vector machines; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Automatic Face and Gesture Recognition (FG), 2013 10th IEEE International Conference and Workshops on
Conference_Location
Shanghai
Print_ISBN
978-1-4673-5545-2
Electronic_ISBN
978-1-4673-5544-5
Type
conf
DOI
10.1109/FG.2013.6553757
Filename
6553757
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