Title :
Dimensional affect recognition using Continuous Conditional Random Fields
Author :
Baltrusaitis, Tadas ; Banda, Ntombikayise ; Robinson, Peter
Author_Institution :
Comput. Lab., Univ. of Cambridge, Cambridge, UK
Abstract :
During everyday interaction people display various non-verbal signals that convey emotions. These signals are multi-modal and range from facial expressions, shifts in posture, head pose, and non-verbal speech. They are subtle, continuous and complex. Our work concentrates on the problem of automatic recognition of emotions from such multimodal signals. Most of the previous work has concentrated on classifying emotions as belonging to a set of categories, or by discretising the continuous dimensional space. We propose the use of Continuous Conditional Random Fields (CCRF) in combination with Support Vector Machines for Regression (SVR) for modeling continuous emotion in dimensional space. Our Correlation Aware Continuous Conditional Random Field (CA-CCRF) exploits the non-orthogonality of emotion dimensions. By using visual features based on geometric shape and appearance, and a carefully selected subset of audio features we show that our CCRF and CA-CCRF approaches outperform previously published baselines for all four affective dimensions of valence, arousal, power and expectancy.
Keywords :
emotion recognition; random processes; regression analysis; support vector machines; SVR; audio feature; continuous conditional random fields; continuous dimensional space; continuous emotion; correlation aware continuous conditional random field; dimensional affect recognition; emotion automatic recognition; emotion classification; emotion dimension; facial expression; geometric shape; head pose; interaction people display; multimodal signal; nonverbal signal; nonverbal speech; posture; support vector machines for regression; Emotion recognition; Face; Feature extraction; Predictive models; Shape; Support vector machines; Vectors;
Conference_Titel :
Automatic Face and Gesture Recognition (FG), 2013 10th IEEE International Conference and Workshops on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5545-2
Electronic_ISBN :
978-1-4673-5544-5
DOI :
10.1109/FG.2013.6553785