Title :
On combining gait features
Author :
Makihara, Yasushi ; Muramatsu, Daigo ; Iwama, Haruyuki ; Yagi, Yasushi
Author_Institution :
Osaka Univ., Suita, Japan
Abstract :
This paper describes a method of gait recognition using multiple gait features in conjunction with score-level fusion techniques. More specifically, we focus on the state-of-the-art period-based gait features such as a gait energy image, a frequency-domain feature, a gait entropy image, a chrono-gait image, and a gait flow image. In addition, we employ various types of the score-level fusion approaches including not only conventional transformation-based approaches (e.g., sum-rule and min-rule) but also classification-based approaches (e.g., support vector machine) and density-based approaches (e.g., Gaussian mixture model, kernel density estimation, linear logistic regression). In experiments, the large-population gait database with 3,249 subjects was used to measure the performance improvement in a statistically reliable way. The experimental results show 7% relative improvement on average with regard to equal error rate of the false acceptance rate and false rejection rate in verification scenarios, and also show 20% reduction of the number of candidates to be checked under 1% misdetection rate on average in screening tasks.
Keywords :
biometrics (access control); feature extraction; gait analysis; image classification; image fusion; object recognition; visual databases; chrono-gait image; classification-based approach; density-based approach; equal error rate; false acceptance rate; false rejection rate; frequency-domain feature; gait energy image; gait entropy image; gait flow image; gait recognition method; large-population gait database; multiple gait features; period-based gait features; score-level fusion techniques; transformation-based approach; Computational modeling; Databases; Feature extraction; Gait recognition; Hidden Markov models; Support vector machines; Training;
Conference_Titel :
Automatic Face and Gesture Recognition (FG), 2013 10th IEEE International Conference and Workshops on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5545-2
Electronic_ISBN :
978-1-4673-5544-5
DOI :
10.1109/FG.2013.6553797