Title :
Facial expression recognition using HessianMKL based multiclass-SVM
Author :
Xiao Zhang ; Mahoor, M.H. ; Voyles, Richard M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Denver, Denver, CO, USA
Abstract :
Multikernel learning (MKL) has recently received great attention in the field of computer vision and pattern recognition. The idea behind MKL is to optimally combine and utilize multiple kernels and features instead of using a single kernel in learning classifiers. This paper presents a novel framework for MKL problem by expanding the HessianMKL algorithm into multiclass-SVM with one-against-one rule. Our framework learns one kernel weight vector for each binary classifier in the multiclass-SVM compared to the SimpleMKL based multiclass-SVM which jointly learns the same kernel weight vector for all binary classifiers. The proposed method is utilized to recognize six basic facial expressions and neutral expression by combining three kernel functions, RBF, Gaussian, and polynomial function and two image representations, HoG and LBPH features. Our experimental results show that our method performed better than SVM classifiers equipped with a single kernel and a single type of feature as well as the SimpleMKL based multiclass-SVM.
Keywords :
Gaussian processes; computer vision; emotion recognition; face recognition; feature extraction; image classification; image representation; learning (artificial intelligence); polynomials; support vector machines; Gaussian function; HessianMKL algorithm; HessianMKL based multiclass-SVM; HoG features; LBPH features; RBF function; SimpleMKL based multiclassSVM; binary classifier; computer vision; facial expression recognition; image representations; kernel functions; kernel weight vector; learning classifiers; multikernel learning; neutral expression; one-against-one rule; pattern recognition; polynomial function; Equations; Face recognition; Kernel; Optimization; Support vector machines; Training; Vectors;
Conference_Titel :
Automatic Face and Gesture Recognition (FG), 2013 10th IEEE International Conference and Workshops on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5545-2
Electronic_ISBN :
978-1-4673-5544-5
DOI :
10.1109/FG.2013.6553807