• DocumentCode
    615324
  • Title

    Microscope image denoising algorithm based on wavelet transform

  • Author

    Yao Jin-li ; Lu Ling-yan

  • Author_Institution
    Coll. of Inf. Technol., Ningbo Dahongying Univ., Ningbo, China
  • fYear
    2013
  • fDate
    26-28 April 2013
  • Firstpage
    529
  • Lastpage
    532
  • Abstract
    When capturing images from the microscope imaging system, the images captured are blur and the information in the images is lost due to noise interference in the collection process. The process of microscopy imaging and the algorithm of microscope image denoising based on wavelet transform are discussed in this paper. Spectrum value and noise variance are used to evaluate the denoising effect. The best value of the wavelet transform number and the range of wavelet transform threshold parameter are obtained after many experiments. The experiments results show that the algorithm can be used without knowing any priori knowledge of the image, and it doesn´t depend on the image´s size to judge the de-nosing threshold and even doesn´t need the image´s noise variance information. The denoising effect using this method is better than using other traditional algorithms such as neighborhood average, median filter and low-pass filter.
  • Keywords
    image denoising; image segmentation; interference; low-pass filters; median filters; microscopy; wavelet transforms; collection process; denoising effect; image information; image noise variance information; low-pass filter; microscope image denoising algorithm; microscope median filter; microscopy imaging process; neighborhood average filter; noise interference; noise variance; spectrum value; wavelet transform number; wavelet transform threshold parameter; Computers; Lenses; Microscopy; Noise; Wavelet transforms; image denoising; image processing; microscope image; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science & Education (ICCSE), 2013 8th International Conference on
  • Conference_Location
    Colombo
  • Print_ISBN
    978-1-4673-4464-7
  • Type

    conf

  • DOI
    10.1109/ICCSE.2013.6553967
  • Filename
    6553967