Universal methodology for embedded system testing

This paper describes testing framework that is capable of testing heterogeneous embedded systems. There are three key contributions. The first is the introduction of a new approach of embedded system testing. The second is simple and efficient embedded system classifier interface, named as discovery interface device for embedded system. The third key contribution is a method for combining classifiers in one module, provides environment and testing methodology for embedded system testing. A set of different experiments in the domain of testing of embedded system is presented. This system yields of embedded system testing comparable to the best previous system implemented on traditional embedded software testing tools. This approach is capable to testing of host based and target based embedded systems.