Title :
Efficient, fast and scalable authentication for VANETs
Author :
Chen Lyu ; Dawu Gu ; Xiaomei Zhang ; Shifeng Sun ; Yinqi Tang
Author_Institution :
Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Vehicular Ad Hoc Networks (VANETs) enable vehicle-to-vehicle communication to enhance road safety and improve driving experience. To secure periodic single-hop beacon messages for VANET applications, digital signature is one of the fundamental security approaches. However, it is vulnerable as excessive signatures would exhaust the computational resources of vehicles. In this paper, we propose a novel authentication mechanism VSPT, VANET authentication with Signatures and Prediction-based TESLA, which combines the advantages of both Elliptic Curve Digital Signature Algorithm (ECDSA) and Prediction-based TESLA. Although ECDSA is computationally expensive, it provides authentication and non-repudiation. Prediction-based TESLA enables fast and efficient verification by exploiting the sender´s ability to predict its own future beacons. Both theoretical analysis and simulation results show that VSPT outperforms either the signature or TESLA in not only lossless situations but also lossy environments.
Keywords :
digital signatures; prediction theory; public key cryptography; road safety; telecommunication security; vehicular ad hoc networks; ECDSA; VANET authentication; VSPT; authentication mechanism; computational resources; driving experience; elliptic curve digital signature algorithm; excessive signature; lossy environment; nonrepudiation; periodic single-hop beacon message; prediction-based TESLA; road safety; security approach; sender ability; vehicle-to-vehicle communication; vehicular ad hoc network; verification; Authentication; Delays; Packet loss; Receivers; Vehicles; Vehicular ad hoc networks; VANETs; authentication; beacons; broadcast communication; signatures;
Conference_Titel :
Wireless Communications and Networking Conference (WCNC), 2013 IEEE
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5938-2
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2013.6554831