• DocumentCode
    616219
  • Title

    Bounds on performance of UWB TOA estimation using finite resolution quantization

  • Author

    Sun, Fei ; Yin, Huarui ; Wang, Weidong

  • Author_Institution
    Department of Electronics Engineering and Information Science, University of Science and Technology of China, HeFei, Anhui, 230027, China
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    2579
  • Lastpage
    2584
  • Abstract
    Impulse radio ultra-wideband (IR-UWB) technology offers an accurate ranging ability by exploiting the time of arrival (TOA) information of the narrow pulse. However, capturing this sub-nanosecond (ns) width pulse in dense multipath environment requires expensive and power-hungry high performance analog-to-digital converters (ADCs) and complex digital signal processing. To reduce the complexity, a finite resolution (FR) receiver that limits quantization to only a few bits has been proposed recently. In this paper, we develop the Cramer-Rao lower bound (CRLB), as a guidance to evaluate the FR quantization influence on IR-UWB TOA estimation. Firstly we define the quantization efficiency and prove that a 2-bit (4-level) quantization is good enough for TOA estimation because it can reach 88% efficiency as a full resolution method. Subsequently, overlapping coefficient is defined to quantify the performance degradation caused by overlapping between the first path and the following multipaths. Finally, we introduce a sub-optimum but more practical FR quantization scheme whose performance asymptotically converges to optimum as the signal to noise ratio (SNR) decreases. FR quantization scheme is demonstrated to achieve a much higher feasibility while holding an acceptable accuracy loss.
  • Keywords
    IEEE 802.15 Standards; Mathematical model; Optimized production technology; Quantization (signal); Signal to noise ratio; Time of arrival estimation; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications and Networking Conference (WCNC), 2013 IEEE
  • Conference_Location
    Shanghai, Shanghai, China
  • ISSN
    1525-3511
  • Print_ISBN
    978-1-4673-5938-2
  • Electronic_ISBN
    1525-3511
  • Type

    conf

  • DOI
    10.1109/WCNC.2013.6554968
  • Filename
    6554968