DocumentCode
616639
Title
Characterization of Multi Pixel Photon Counter (MPPC) Array. Statistical approach
Author
Soto, Orlando ; Rojas, Renan ; Kuleshov, Sergey ; Hakobyan, H. ; Toro, Alam ; Brooks, William K. ; Olivares, Maria
Author_Institution
Dept. de Ing. Electron., Univ. Tec. Federico Santa Maria, Valparaiso, Chile
fYear
2013
fDate
6-9 May 2013
Firstpage
157
Lastpage
161
Abstract
The novel Hamamatsu Multi Pixel Photon Counter Array S12045(X) is an array of 16 individual MPPCs (3×3 [mm2]) (further in the article MPPC array channel) each with 3600 G-APD (Geiger-mode Avalanche Photodiode) pixels (50×50 [μ m2]). Each MPPC in the array works with its individual reverse bias voltage around 70[V]. We studied the main features of each MPPC array channel for 2800 MPPC arrays at different temperatures. Two measurement systems were built to extract Gain, Breakdown Voltage, Photon Detection Efficiency (PDE), Optical Cross-talk and Dark rate for each MPPC array channel. The article describes the characterization process of MPPC arrays used in GlueX experiment (Jefferson Lab, Hall D). The hardware and the performed data analysis are described, which include new analytical expressions to obtain the number of photoelectrons and Optical Cross-Talk. The dynamical behavior of characterization parameters is presented as well.
Keywords
Geiger counters; avalanche photodiodes; data analysis; optical crosstalk; optical sensors; photodetectors; photon counting; sensor arrays; statistical analysis; voltage measurement; G-APD; Geiger-mode avalanche photodiode; GlueX experiment; Hamamatsu multipixel photon counter array channel; MPPC; PDE; breakdown voltage; dark rate; data analysis; gain extraction; measurement systems; optical crosstalk; photoelectron; photon detection efficiency; statistical approach; Arrays; Copper; Light emitting diodes; Monitoring; Optical crosstalk; Photonics; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location
Minneapolis, MN
ISSN
1091-5281
Print_ISBN
978-1-4673-4621-4
Type
conf
DOI
10.1109/I2MTC.2013.6555401
Filename
6555401
Link To Document