• DocumentCode
    61664
  • Title

    Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes

  • Author

    Ganguly, A. ; Kundu, D. ; Mitra, S.

  • Author_Institution
    Dept. of Stat., Savitribai Phule Pune Univ., Pune, India
  • Volume
    64
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    473
  • Lastpage
    485
  • Abstract
    The step-stress model is becoming quite popular for analyzing lifetime data obtained from accelerated life testing experiments. In the usual step-stress experiment, stress levels are allowed to change at each step to get rapid failure of the experimental units. The simple step-stress model under different censoring schemes based on Weibull lifetimes is considered in this paper. It is assumed that the lifetime distributions of the experimental units have different scale parameters at different stress levels, but they have the same shape parameter. Moreover, it is assumed that the lifetimes follow the Khamis-Higgins model. It is further assumed that, as the stress level increases, the scale parameter also increases. We provide Bayesian inference of the unknown parameters of the Weibull distribution under this order restriction on the scale parameters. Monte Carlo simulations have been performed to see the effectiveness of the proposed method, and a data set has been analyzed for illustrative purposes.
  • Keywords
    Bayes methods; Monte Carlo methods; Weibull distribution; failure analysis; life testing; Bayesian analysis; Bayesian inference; Khamis-Higgins model; Monte Carlo simulation; Weibull distribution; Weibull lifetime; accelerated life testing experiment; censoring scheme; experimental units; lifetime data analysis; lifetime distribution; rapid failure; scale parameter; simple step-stress model; step-stress experiment; stress level changing; Analytical models; Bayes methods; Data models; Mathematical model; Shape; Stress; Weibull distribution; Censoring schemes; Khamis-Higgins model; posterior analysis; prior distribution; step-stress life-tests;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2014.2368871
  • Filename
    6969122