DocumentCode
616693
Title
Resonant frequency analysis for spring-mass structure in high-g MEMS accelerometer
Author
Zhenya Geng ; Vi Shen ; Miao Zhang ; Muhua Li ; Jing Jin
Author_Institution
Dept. of Eng. & Controlling, Harbin Inst. of Technol., Harbin, China
fYear
2013
fDate
6-9 May 2013
Firstpage
440
Lastpage
443
Abstract
Spring-mass structure of high-g MEMS accelerometer is designed based on lumped-parameter analytical models and polymer film-beam constraints structure. The film-beam bone of spring-mass structure is used from silicon and organic polymer film material. The mechanical structure characteristic performs a sort of vibration flexibility to resonant frequency from its single proof-mass movement. According to the result of simulation and analysis, the parameters size of spring-mass structure is obtained to optimize on operational frequency and high-g range. At the same time, its sensitivity capability is improved to high-g MEMS accelerometer. Besides, stress curve and strain situation of the spring-mass structure are obtained by acceleration force opposing motion simulation. These simulation data describes elasticity architecture rationality of mechanical components, which provides favorable help to accomplish coating organic polymer film fabrication. The design and coating polymer fabrication can enhance robustness and stability to high-g MEMS accelerometer.
Keywords
accelerometers; microfabrication; microsensors; polymer films; silicon; acceleration force; coating organic polymer film fabrication; film-beam bone; high-g MEMS accelerometer; lumped-parameter analytical models; mechanical components; mechanical structure characteristic; motion simulation; organic polymer film material; polymer film-beam constraints structure; proof-mass movement; resonant frequency analysis; silicon polymer film material; spring-mass structure; vibration flexibility; Accelerometers; Analytical models; Elasticity; Micromechanical devices; Resonant frequency; Stress; Vibrations; Spring-mass structure; high-g MEMS accelerometer; resonant frequency; sensitivity capability;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location
Minneapolis, MN
ISSN
1091-5281
Print_ISBN
978-1-4673-4621-4
Type
conf
DOI
10.1109/I2MTC.2013.6555456
Filename
6555456
Link To Document