DocumentCode
616810
Title
A fine time-resolution (≪ 3 ps-rms) time-to-digital converter for highly integrated designs
Author
Perktold, Lukas ; Christiansen, Jorgen
Author_Institution
Graz Univ. of Technol., Graz, Austria
fYear
2013
fDate
6-9 May 2013
Firstpage
1092
Lastpage
1097
Abstract
A multi-channel 3-ps-rms single-shot precision timeto-digital converter (TDC) is presented. The time interpolation is based on a delay-locked-loop (DLL) employing resistive interpolation to achieve least-significant-bit (LSB) sizes as small as 5 ps. To calibrate out device mismatches, only the timing-reference signals need to be calibrated. The usual need for calibrating each channel individually is avoided. After calibration, the measured differential-non-linearity (DNL) and integral-non-linearity (INL) are ±0.9 LSB and ±1.3 LSB respectively. A prototype, implemented in a commercial 130 nm technology, consumes between 34mW to 42 mW/channel and shows a voltage sensitivity of -0.19 ps/mV and a temperature dependence of 0.44 ps/°C. To the best of our knowledge this is the first time a TDC demonstrates single-shot precisions on multiple channels smaller than 3ps-rms.
Keywords
analogue-digital conversion; interpolation; time measurement; channel individually; delay-locked-loop; differential-nonlinearity; fine time-resolution; highly integrated designs; integral-nonlinearity; resistive interpolation; single-shot precision; time interpolation; time-to-digital converter; wavelength 130 nm; Calibration; Clocks; Interpolation; Jitter; Radiation detectors; Registers; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location
Minneapolis, MN
ISSN
1091-5281
Print_ISBN
978-1-4673-4621-4
Type
conf
DOI
10.1109/I2MTC.2013.6555583
Filename
6555583
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