Title :
Pseudo non-dyadic second generation wavelet tight frame for machine fault diagnosis
Author :
Binqiang Chen ; Zhousuo Zhang ; Jie Zhang ; Zhibo Yang ; Zhengjia He
Author_Institution :
Sch. of Mech. Eng., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
This paper investigates a novel wavelet tight frame (WTF) constructing strategy for obtaining pseudo second generation bases with non-dyadic time-frequency partition grids. The proposed constructing strategy starts with a known second generation wavelet basis and applies it in an undecimated filterbank. Via forward and inverse transformation procedure, an input signal is decomposed into a set of dyadic wavelet packets. By introducing a systematic way of wavelet packet reordering and ensemble wavelet generating method, another corresponding set of non-dyadic wavelet packets are generated. It is demonstrated that the derived pseudo non-dyadic second generation wavelet packets (PNSGW) are associated with well-defined band-pass filters, which ensure good time-frequency localizability and exact shift-invariance. The PNSGW strategy is combined with spectral kurtosis to detect incipient faults in mechanical systems. The processing results show that the proposed technique is a well complement to conventional dyadic wavelet transform in investigating transient impulse responses caused by faulty mechanical components.
Keywords :
band-pass filters; fault diagnosis; harmonic generation; wavelet transforms; PNSGW strategy; band-pass filters; dyadic wavelet transform; machine fault diagnosis; nondyadic wavelet packets; pseudo nondyadic second generation; shift-invariance; undecimated filterbank; wavelet packet reordering; wavelet tight frame; Discrete wavelet transforms; Testing; Time-frequency analysis; Vibrations; Wavelet packets; fault diagnosis; pseudo wavelet tight frame; second generation wavelet packet; shift invariance; undecimated filterbank;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-4673-4621-4
DOI :
10.1109/I2MTC.2013.6555655