DocumentCode
616896
Title
Operation of the Van Veen Loop in a shielded chamber
Author
McLean, James ; Sako, H. ; Medina, Aurelio ; Sutton, Robert
Author_Institution
TDK R & D Corp., Cedar Park, TX, USA
fYear
2013
fDate
6-9 May 2013
Firstpage
1567
Lastpage
1572
Abstract
The Van Veen Loop or Large Loop Antenna (LLA) has been shown to be invaluable for the rapid characterization of the magnetic fields of certain compact devices such as ballasts for fluorescent lighting. Here, operation of the LLA in a shielded, semi-anechoic chamber is considered, including the calibration/verification of the loop using the folded-dipole verification source described in the standard CISPR 16-2-3. The LLA is characterized experimentally in a typical 3-m semi-anechoic chamber using the folded-dipole validation source specified in the CISPR 16-2-3 standard. It is shown that the response of the LLA is slightly affected by the presence of the chamber, but nevertheless provides accurate measurement of magnetic dipole moment over a very broad frequency range. Specifically, the LLA described here meets the accuracy requirements of the CISPR 162-3 standard over the frequency range of 9 kHz to 30 MHz when operating inside a shielded semi-anechoic chamber of dimensions 9 m (length) x 6 m (width) × 5.4 m (height). It can be concluded that the LLA can be used effectively in a typical shielded semi-anechoic chamber.
Keywords
HF antennas; VHF antennas; anechoic chambers (electromagnetic); calibration; dipole antennas; loop antennas; magnetic field measurement; magnetic moments; magnetic shielding; measurement standards; CISPR 16-2-3. standard; LLA; Van Veen loop; ballast; calibration-verification; fluorescent lighting; folded-dipole verification source; frequency 9 kHz to 30 MHz; large loop antenna; magnetic dipole moment measurement; magnetic field; shielded semianechoic chamber; size 3 m; Current transformers; Feeds; Impedance; Magnetic moments; Magnetic noise; Magnetic resonance; Magnetic shielding;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location
Minneapolis, MN
ISSN
1091-5281
Print_ISBN
978-1-4673-4621-4
Type
conf
DOI
10.1109/I2MTC.2013.6555678
Filename
6555678
Link To Document