DocumentCode
616948
Title
Automatic inspection of backlight modules by using support vector regressions
Author
Wu-Ja Lin ; Sin-Sin Jhuo
Author_Institution
Dept. of Comput. Sci. & Inf. Eng., Nat. Formosa Univ., Yunlin, Taiwan
fYear
2013
fDate
6-9 May 2013
Firstpage
1834
Lastpage
1837
Abstract
In this manuscript, we propose to use the support vector regressions to inspect the backlight modules. In building the models of the support vector regressions, various combinations of parameters are examined and the accuracy are found to be similar. Experimental results show that the accuracy achieved by the proposed method is satisfactory.
Keywords
computerised instrumentation; inspection; liquid crystal displays; regression analysis; support vector machines; LCD devices; automatic inspection; backlight modules; liquid crystal display; support vector regressions; Accuracy; Cameras; Charge coupled devices; Inspection; Noise; Support vector machines; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location
Minneapolis, MN
ISSN
1091-5281
Print_ISBN
978-1-4673-4621-4
Type
conf
DOI
10.1109/I2MTC.2013.6555731
Filename
6555731
Link To Document