Title :
SAR Doppler Ambiguity Resolver Based on Entropy Minimization
Author :
Tao Zeng ; Zheng Lu ; Zegang Ding ; Mingming Bian
Author_Institution :
Dept. of Electron. Eng., Beijing Inst. of Technol., Beijing, China
Abstract :
The determination of Doppler ambiguity number (DAN) is indispensable for the generation of high-quality synthetic aperture radar (SAR) images. An incorrect DAN leads to lower image signal-to-noise ratio and degradation in the system impulse response function. Based on the relationship between DAN errors and the image quality, a novel DAN estimation algorithm named image-quality-based Doppler ambiguity resolver is presented. In the proposed algorithm, the DAN-dependent linear range cell migration correction and DAN-dependent azimuth compression are carried out in subscenes to obtain 2-D compressed SAR images, which are further employed to estimate DAN via minimizing the entropy. The presented algorithm is more robust than conventional methods to cope with demands of both low- and high-contrast scene applications. In addition, the approach is computationally efficient because it can be properly applied to segments of range-compressed data in small size and only a few sets of short fast Fourier transforms are required. Finally, experiments over real data of airborne X-band and spaceborne C-band are carried out to demonstrate the performance of the proposed approach.
Keywords :
Doppler radar; Fourier transforms; image coding; minimisation; radar imaging; synthetic aperture radar; DAN errors; SAR doppler ambiguity resolver; airborne X-band; entropy minimization; high-contrast scene applications; high-quality synthetic aperture radar images; image quality; image signal-to-noise ratio; impulse response function; short fast Fourier transforms; spaceborne C-band; Azimuth; Doppler effect; Entropy; Estimation; Image quality; Robustness; Synthetic aperture radar; Doppler ambiguity resolver (DAR); Doppler centroid estimation; synthetic aperture radar (SAR);
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
DOI :
10.1109/TGRS.2013.2240305