• DocumentCode
    617099
  • Title

    Gearbox fault detection by wavelet and spectrum analysis of the induction motor power

  • Author

    Flores, A.Q. ; Cardoso, Antonio J. Marques ; Carvalho, J.B.

  • Author_Institution
    Electr. Eng. Dept., Inst. Super. de Eng. do Porto, Porto, Portugal
  • fYear
    2013
  • fDate
    12-15 May 2013
  • Firstpage
    88
  • Lastpage
    92
  • Abstract
    This paper presents a new diagnostic method based on the induction motor three-phase power analysis that is able to detect gear broken teeth. A gearbox mathematical model was developed to simulate the healthy and the broken tooth conditions. The simulation and experimental tests proved that the wavelet and spectrum analysis of the induction motor (IM) three-phase power are valuable techniques to diagnose gearbox broken teeth. However, the wavelet analysis method has the advantage of being able to detect the defect of broken teeth even in situations where the mechanical load is not constant, a situation in which the spectrum analysis method is not effective. Another advantage of the wavelet analysis method is the fact that it can diagnose broken teeth without having the knowledge of the healthy condition data. This remote diagnostic method can be useful in systems difficult to access.
  • Keywords
    fault diagnosis; gears; induction motors; mathematical analysis; spectral analysers; wavelet transforms; IM three-phase power; gear broken teeth detection; gearbox fault detection; gearbox mathematical model; health condition data; induction motor three-phase power analysis; mechanical load; remote diagnostic method; spectrum analysis method; wavelet analysis method; wheels; Gears; Induction motors; Mathematical model; Rotors; Standards; Torque; Wheels; Condition Monitoring; FFT; Gearbox; Gears; Induction Motor; Instantaneous Power; Mechanical Fault Diagnosis; Mechanical Power Transmission; Wavelet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Machines & Drives Conference (IEMDC), 2013 IEEE International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4673-4975-8
  • Electronic_ISBN
    978-1-4673-4973-4
  • Type

    conf

  • DOI
    10.1109/IEMDC.2013.6556237
  • Filename
    6556237