Title :
Variational attenuation correction of two-view confocal microscopic recordings
Author :
Schmidt, Ted ; Durr, Jasmin ; Keuper, Margret ; Blein, Thomas ; Palme, Klaus ; Ronneberger, Olaf
Author_Institution :
Image Anal. Lab., Albert-Ludwigs-Univ. Freiburg, Freiburg, Germany
Abstract :
We present an approach to recover attenuation-free intensities of a thick sample, that is imaged by a standard confocal microscope from two views (top and bottom). A variational approach simultaneously estimates the local signal attenuation and the real attenuation-free intensity at each position. Compared to earlier work we introduce a refined image formation model, that models photo-bleaching and photon noise using Poisson image statistics. We examine the effects of different regularization methods on the absorption field (Tikhonov-Miller, Total Variation, and sparsity) and the benefit of a constrained optimization in comparison to an orthogonal subspace projection. We quantify the efficacy of the approach on synthetically generated samples, and show its general applicability on two real biological applications, namely the recordings of zebrafish embryos and Arabidopsis thaliana root tips.
Keywords :
Poisson distribution; biological techniques; biology computing; image reconstruction; optical microscopy; optical saturable absorption; optimisation; variational techniques; Arabidopsis thaliana root tips recording; Poisson image statistics; Tikhonov-Miller method; absorption field; attenuation-free intensity recovery; biological application; constrained optimization; local signal attenuation; orthogonal subspace projection; photobleaching; photon noise; refined image formation model; regularization method; sparsity; standard confocal microscopy; total variation method; two-view confocal microscopic recording; variational approach; zebrafish embryo recording; Absorption; Attenuation; Bleaching; Microscopy; Noise; Phantoms; TV; Attenuation correction; calculus of variations; confocal microscopy;
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-6456-0
DOI :
10.1109/ISBI.2013.6556439