DocumentCode :
617294
Title :
Multi-Channel brain atrophy pattern analysis in neuroimaging retrieval
Author :
Sidong Liu ; Weidong Cai ; Lingfeng Wen ; Dagan Feng
Author_Institution :
Res. Group, Univ. of Sydney, Sydney, NSW, Australia
fYear :
2013
fDate :
7-11 April 2013
Firstpage :
202
Lastpage :
205
Abstract :
The high throughput 3D neuroimaging datasets have posed great challenges for neuroimaging data retrieval. To achieve more accurate neuroimaging retrieval, various content-based retrieval approaches have been proposed. Recent studies showed a tendency of using the localized features extracted from a subset of the brain structures, instead of the global features extracted from whole brain. However, these studies relied heavily on specific pattern analysis techniques or clinical expertise. In this study we proposed a Multi-Channel pattern analysis approach to identify the most discriminative disease-sensitive brain structures for neurodegenerative disorders and thus to enhance neuroimaging retrieval. The preliminary results suggested that the proposed Multi-Channel pattern analysis approach could confidently identify the brain structures with atrophy and further improve the neuroimaging retrieval performance.
Keywords :
brain; diseases; feature extraction; image retrieval; medical disorders; medical image processing; neurophysiology; pattern classification; brain structure identification; brain structure subset; content-based retrieval approach; discriminative disease-sensitive brain structure; global feature extraction; high throughput 3D neuroimaging dataset; localized feature extraction; multichannel brain atrophy pattern analysis; neurodegenerative disorder; neuroimaging data retrieval; neuroimaging retrieval enhancement; pattern analysis technique; Alzheimer´s disease; Atrophy; Brain; Magnetic resonance imaging; Neuroimaging; Pattern analysis; Support vector machines; multi-channel analysis; neuroimaging retrieval;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
ISSN :
1945-7928
Print_ISBN :
978-1-4673-6456-0
Type :
conf
DOI :
10.1109/ISBI.2013.6556447
Filename :
6556447
Link To Document :
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