DocumentCode :
617381
Title :
Neuroelectromagnetic imaging of correlated sources using a novel subspace penalized sparse learning
Author :
Jae Jun Yoo ; Jongmin Kim ; Chang-Hwan Im ; Jong Chul Ye
Author_Institution :
Dept. of Bio & Brain Eng., KAIST, Daejeon, South Korea
fYear :
2013
fDate :
7-11 April 2013
Firstpage :
552
Lastpage :
555
Abstract :
Localization of brain signal sources from EEG/MEG has been an active area of research [1]. Currently, there exists a variety of approaches such as MUSIC [2], M-SBL [3], and etc. These algorithms have been applied for various clinical examples and demonstrated excellent performances. However, when the unknown sources are highly correlated, the conventional algorithms often exhibit spurious reconstructions. To address the problem, this paper proposes a new algorithm that generalizes M-SBL by exploiting the fundamental subspace geometry in the multiple measurement problem (MMV). Experimental results using simulation and real phantom data show that the proposed algorithm outperforms the existing methods even under a highly correlated source condition.
Keywords :
belief networks; electroencephalography; image reconstruction; learning (artificial intelligence); magnetoencephalography; medical image processing; phantoms; EEG-MEG; M-SBL; MMV; brain signal sources; correlated source condition; electroencephalography; fundamental subspace geometry; magnetoencephalography; multiple measurement problem; multiple sparse Bayesian learning; neuroelectromagnetic imaging; real phantom data; simulation phantom data; spurious reconstructions; subspace penalized sparse learning; Algorithm design and analysis; Brain modeling; Electroencephalography; Imaging; Multiple signal classification; Position measurement; Signal processing algorithms; EEG/MEG source imaging; M-SBL; MUSIC; joint sparse recovery;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
ISSN :
1945-7928
Print_ISBN :
978-1-4673-6456-0
Type :
conf
DOI :
10.1109/ISBI.2013.6556534
Filename :
6556534
Link To Document :
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