Title :
Inferring functional network-based signatures via structurally-weighted LASSO model
Author :
Dajiang Zhu ; Dinggang Shen ; Tianming Liu
Author_Institution :
Dept. of Comput. Sci., Univ. of Georgia, Athens, GA, USA
Abstract :
Most current research approaches for functional/effective connectivity analysis focus on pair-wise connectivity and cannot deal with network-scale functional interactions. In this paper, we propose a structurally-weighted LASSO (SW-LASSO) regression model to represent the functional interaction among multiple regions of interests (ROIs) based on resting state fMRI (R-fMRI) data. The structural connectivity constraints derived from diffusion tensor imaging (DTI) data will guide the selection of the weights which adjust the penalty levels of different coefficients corresponding to different ROIs. Using the Default Mode Network (DMN) as a test-bed, our results indicate that the learned SW-LASSO has good capability of differentiating Mild Cognitive Impairment (MCI) subjects from their normal controls and has promising potential to characterize the brain functions among different condition, thus serving as the functional network-based signature.
Keywords :
biodiffusion; biomedical MRI; brain; cognition; medical computing; medical disorders; neural nets; neurophysiology; regression analysis; Default Mode Network; Mild Cognitive Impairment subjects; R-fMRI data; ROI; SW-LASSO regression model; brain function; diffusion tensor imaging data; effective connectivity analysis; functional connectivity analysis; functional network-based signature inferring; multiple regions of interests; network-scale functional interaction; pair-wise connectivity; penalty level coefficient; resting state fMRI data; structural connectivity constraint; structurally-weighted LASSO regression model; Accuracy; Brain modeling; Computational modeling; Imaging; Joining processes; Neuroscience; Support vector machines; Functional network-based signature; regression model;
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-6456-0
DOI :
10.1109/ISBI.2013.6556638