DocumentCode :
617501
Title :
Registration of multiple stained histological sections
Author :
Borovec, Jiri ; Kybic, Jan ; Busta, Michal ; Ortiz-de-Solorzano, Carlos ; Munoz-Barrutia, Arrate
Author_Institution :
Czech Tech. Univ. in Prague, Prague, Czech Republic
fYear :
2013
fDate :
7-11 April 2013
Firstpage :
1034
Lastpage :
1037
Abstract :
The analysis of protein-level multigene expression signature maps computed from the fusion of differently stained immunohistochemistry images is an emerging tool in cancer management. Creating these maps requires registering sets of histological images, a challenging task due to their large size, the non-linear distortions existing between consecutive sections and to the fact that the images correspond to different histological stains and thus, may have very different appearance. In this manuscript, we present a novel segmentation-based registration algorithm that exploits a multi-class pyramid and optimizes a fuzzy class assignment specially designed for this task. Compared to a standard nonrigid registration, the proposed method achieves an improved matching on both synthetic as well as real histological images of cancer lesions.
Keywords :
biochemistry; biomedical optical imaging; cancer; fuzzy systems; genetics; genomics; image fusion; image matching; image registration; image segmentation; lung; medical image processing; molecular biophysics; proteins; cancer lesions; cancer management; fuzzy class assignment; histological image registering sets; multiclass pyramid; multiple stained histological section registration; nonlinear distortions; protein-level multigene expression signature map analysis; segmentation-based registration algorithm; stained immunohistochemistry image fusion; standard nonrigid registration; Cancer; Image segmentation; Lesions; Lungs; Measurement; Merging; Optimization; Non-rigid registration; light microscopy images; lung cancer; multiclass matching; superpixel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
ISSN :
1945-7928
Print_ISBN :
978-1-4673-6456-0
Type :
conf
DOI :
10.1109/ISBI.2013.6556654
Filename :
6556654
Link To Document :
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