DocumentCode
617518
Title
Semi-automatic classification of lesion patterns in patients with clinically isolated syndrome
Author
Crimi, A. ; Commowick, Olivier ; Ferre, J.C. ; Maarouf, A. ; Edan, G. ; Barillot, C.
fYear
2013
fDate
7-11 April 2013
Firstpage
1102
Lastpage
1105
Abstract
Multiple sclerosis (MS) is neuro-degenerative disease of the Central Nervous System characterized by the loss of myelin. A Clinically Isolated Syndrome (CIS) is a first neurological episode caused by inflammation/demyelination in the central nervous system which may lead to MS. Better understanding of the disease at its onset will lead to a better discovery of pathogenic mechanisms, allowing suitable therapies at an early stage. We propose an automatic segmentation algorithm for two different contrast agents, used within a framework for early characterization of CIS patients according to lesion patterns, and more specifically according to the nature of the inflammatory patterns of these lesions. We expect that the proposed framework can infer new prospective figures from the earliest imaging signs of MS since it can provide a classification of different types of lesions across patients. The lesion detection algorithm based on intensity normalization and subtraction of the used MRI data is a pivotal step, since it avoids the time-demanding task of manual delineation.
Keywords
biomedical MRI; diseases; feature extraction; image classification; image segmentation; medical image processing; neurophysiology; CIS patients; MRI data; automatic segmentation algorithm; central nervous system; clinically isolated syndrome; contrast agents; feature extraction; inflammation-demyelination; lesion pattern semiautomatic classification; manual delineation; myelin loss; neurodegenerative disease; pathogenic mechanism; pivotal step; time-demanding task; Diseases; Histograms; Indexes; Lesions; Magnetic resonance imaging; Manuals; Vectors; MS; Segmentation; USPIO; longitudinal Study;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location
San Francisco, CA
ISSN
1945-7928
Print_ISBN
978-1-4673-6456-0
Type
conf
DOI
10.1109/ISBI.2013.6556671
Filename
6556671
Link To Document