DocumentCode :
617541
Title :
3D Haar-like elliptical features for object classification in microscopy
Author :
Amat, Fernando ; Keller, Philipp J.
Author_Institution :
Howard Hughes Med. Inst., Ashburn, VA, USA
fYear :
2013
fDate :
7-11 April 2013
Firstpage :
1194
Lastpage :
1197
Abstract :
Object detection and classification are key tasks in computer vision that can facilitate high-throughput image analysis of microscopy data. We present a set of local image descriptors for three-dimensional (3D) microscopy datasets inspired by the well-known Haar wavelet framework. We add orientation, illumination and scale information by assuming that the neighborhood surrounding points of interests in the image can be described with ellipsoids, and we increase discriminative power by incorporating edge and shape information into the features. The calculation of the local image descriptors is implemented in a Graphics Processing Unit (GPU) in order to reduce computation time to 1 millisecond per object of interest. We present results for cell division detection in 3D time-lapse fluorescence microscopy with 97.6% accuracy.
Keywords :
Haar transforms; biological techniques; biology computing; cellular biophysics; computer vision; fluorescence spectroscopy; graphics processing units; image classification; optical microscopy; wavelet transforms; 3D Haar like elliptical features; 3D microscopy datasets; 3D time lapse fluorescence microscopy; GPU; Haar wavelet framework; cell division detection; computer vision; discriminative power; edge information; ellipsoids; graphics processing unit; high throughput image analysis; illumination information; local image descriptors; object classification; object detection; orientation information; scale information; shape information; Ellipsoids; Feature extraction; Graphics processing units; Microscopy; Object detection; Shape; Haar features; cell division; light microscopy; local descriptors; object classification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
ISSN :
1945-7928
Print_ISBN :
978-1-4673-6456-0
Type :
conf
DOI :
10.1109/ISBI.2013.6556694
Filename :
6556694
Link To Document :
بازگشت