• DocumentCode
    617771
  • Title

    Using graph transformation and maude to simulate and verify UML models

  • Author

    Chama, Wafa ; Elmansouri, Rachid ; Chaoui, Abdelmadjid

  • Author_Institution
    Dept. of Comput. Sci. & its Applic., Univ. Constantine 2, Constantine, Algeria
  • fYear
    2013
  • fDate
    9-11 May 2013
  • Firstpage
    459
  • Lastpage
    464
  • Abstract
    UML is a standard language for object-oriented paradigm with an open notation and several concepts to be widely used in software modeling. However, the poorness of modeling languages to deal with simulation and verification has actuated researchers to use formal representations. Maude is the specification language of rewriting logic that allows simulation and verification of properties with its LTL model-checker. So, the transformation of UML models to Maude specification seems to be a good approach that deals with the limits of UML. The contribution of this paper is twofold. Firstly, we improved our graph grammar presented in a previous work by replacing it with two complementary graph grammars to generate more easily Maude specifications. Secondary, we performed the verification of some properties of the obtained formal Maude models using Maude LTL Model-checker. An illustrative example is presented.
  • Keywords
    Unified Modeling Language; graph grammars; object-oriented methods; program verification; rewriting systems; Maude LTL model-checker; Maude specification; UML model simulation; UML model transformation; UML model verification; complementary graph grammars; formal Maude models; formal representations; graph grammar; graph transformation; logic rewriting; modeling languages; object-oriented paradigm; software modeling; specification language; Grammar; Unified modeling language; AToM3 Tool; Automatic Code Generation; Graph Grammar; Maude; Maude LTL Model-Checker; Meta-Modeling; Rewriting Logic; UML Models; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE), 2013 International Conference on
  • Conference_Location
    Konya
  • Print_ISBN
    978-1-4673-5612-1
  • Type

    conf

  • DOI
    10.1109/TAEECE.2013.6557318
  • Filename
    6557318