Title :
Investigation of transmittance spectra in Si-based one-dimensional photonic crystals with defect
Author :
Korkmaz, V. ; Cetin, Aykut ; Ucgun, E.
Author_Institution :
Inf. & Commun. Technol. Authority (ICT A), Ankara, Turkey
Abstract :
By using the transfer matrix method (TMM), we analyzed the properties of the transmittance spectra and photonic band of light in the 1D (one-dimensional) photonic structure with defect, which was fictionalized with two different dielectric layers. The device is designed as multilayer Si/SiO2 structure with defect in the middle of the periodic photonic crystal system. The change of defect mode and the band gap in A0=1550 nm central wavelength in optical communication region is investigated for the different angles of incidence of light and two different dielectric defect layers.
Keywords :
dielectric thin films; elemental semiconductors; infrared spectra; multilayers; photonic band gap; photonic crystals; silicon; silicon compounds; Si-SiO2; Si-based one-dimensional photonic crystals; TMM; band gap; defect mode; dielectric defect layers; light incidence angles; multilayer structure; optical communication region; periodic photonic crystal system; photonic band; transfer matrix method; transmittance spectra; wavelength 1550 nm; Optical reflection; Photonics; defect mode; photonic band gap; photonic crystals; transfer matrix method;
Conference_Titel :
Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE), 2013 International Conference on
Conference_Location :
Konya
Print_ISBN :
978-1-4673-5612-1
DOI :
10.1109/TAEECE.2013.6557335
