Title :
Accurate crosstalk analysis for RLCG on-chip VLSI global interconnect
Author :
Maheshwari, V. ; Jha, Sumit Kumar ; Khare, Kavita ; Kar, Rajib ; Mandal, Durbadal
Author_Institution :
Deptt. of ECE, Apeejay Stya Univ., Gurgaon, India
Abstract :
This paper shows an accurate crosstalk noise analysis for RLCG on-chip VLSI global interconnects and also presents a fast response and accurate estimation of crosstalk noise generated due to coupling effect in multiple RLCG transmission lines. Due to the coupling effect, the performance of interconnect is degraded. This degradation is seen by the electronic design automation (EDA) tools. This RLCG transmission line is used for high frequency operations, so the estimation method for RLCG peak crosstalk noise is complex but give the fast and more accurate and better result comparable to the RC and RLC onchip VLSI global interconnects. In this paper the loading effect between aggressor and victim network has been considered and finally the expression for the peak crosstalk noise has been derived. This method gives a very fast and improved result than that of the SPICE result. The average error achieved for the peak noise is 1.88%.
Keywords :
RLC circuits; VLSI; electronic design automation; integrated circuit interconnections; integrated circuit noise; transmission lines; EDA tools; RLCG on-chip VLSI global interconnects; accurate crosstalk noise analysis; accurate crosstalk noise estimation; aggressor; coupling effect; electronic design automation tools; fast response; high frequency operations; interconnect performance degradation; loading effect; multiple RLCG transmission lines; peak crosstalk noise; victim network; Capacitance; Couplings; Crosstalk; Equations; Integrated circuit modeling; Mathematical model; Noise; Crosstalk; Distributed RLC segments; On-Chip Interconnect; Output response; VLSI Noise Peak;
Conference_Titel :
Information & Communication Technologies (ICT), 2013 IEEE Conference on
Conference_Location :
JeJu Island
Print_ISBN :
978-1-4673-5759-3
DOI :
10.1109/CICT.2013.6558106