• DocumentCode
    618517
  • Title

    Frequency domain power and thermal integrity analysis of 3D power delivery networks

  • Author

    Todri-Sanial, Aida

  • Author_Institution
    LIRMM, Univ. Montpellier 2, Montpellier, France
  • fYear
    2013
  • fDate
    12-15 May 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    3D power delivery networks are essential for delivering supply voltage to all tiers. PDNs on each tier are mesh networks that are bridged together using Through-Silicon-Vias (TSVs) to devise 3D PDNs. However, a host of vulnerabilities influence their resiliency and reliability such as power supply noise, long parasitic current paths, switching activities, high frequencies, and sensitivity to temperature variations. In this work, we perform a qualitative analysis to capture the impact of TSV-to-TSV substrate coupling (inductive and capacitive), power supply noise transfer among tiers, and different PDN topologies on 3D PDNs. Experiments show the criticality of these factors and their impact on power and thermal integrity of 3D PDNs.
  • Keywords
    frequency-domain analysis; integrated circuit reliability; three-dimensional integrated circuits; 3D PDN; 3D power delivery networks; TSV-to-TSV substrate coupling; frequency domain power integrity analysis; inductive-capacitive coupling; mesh networks; parasitic current path; power supply noise transfer; supply voltage delivery; switching activity; thermal integrity analysis; through-silicon-vias; Couplings; Integrated circuit modeling; Noise; Resonant frequency; Switching frequency; Through-silicon vias; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5678-7
  • Type

    conf

  • DOI
    10.1109/SaPIW.2013.6558328
  • Filename
    6558328