DocumentCode
618517
Title
Frequency domain power and thermal integrity analysis of 3D power delivery networks
Author
Todri-Sanial, Aida
Author_Institution
LIRMM, Univ. Montpellier 2, Montpellier, France
fYear
2013
fDate
12-15 May 2013
Firstpage
1
Lastpage
4
Abstract
3D power delivery networks are essential for delivering supply voltage to all tiers. PDNs on each tier are mesh networks that are bridged together using Through-Silicon-Vias (TSVs) to devise 3D PDNs. However, a host of vulnerabilities influence their resiliency and reliability such as power supply noise, long parasitic current paths, switching activities, high frequencies, and sensitivity to temperature variations. In this work, we perform a qualitative analysis to capture the impact of TSV-to-TSV substrate coupling (inductive and capacitive), power supply noise transfer among tiers, and different PDN topologies on 3D PDNs. Experiments show the criticality of these factors and their impact on power and thermal integrity of 3D PDNs.
Keywords
frequency-domain analysis; integrated circuit reliability; three-dimensional integrated circuits; 3D PDN; 3D power delivery networks; TSV-to-TSV substrate coupling; frequency domain power integrity analysis; inductive-capacitive coupling; mesh networks; parasitic current path; power supply noise transfer; supply voltage delivery; switching activity; thermal integrity analysis; through-silicon-vias; Couplings; Integrated circuit modeling; Noise; Resonant frequency; Switching frequency; Through-silicon vias; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location
Paris
Print_ISBN
978-1-4673-5678-7
Type
conf
DOI
10.1109/SaPIW.2013.6558328
Filename
6558328
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