DocumentCode :
618517
Title :
Frequency domain power and thermal integrity analysis of 3D power delivery networks
Author :
Todri-Sanial, Aida
Author_Institution :
LIRMM, Univ. Montpellier 2, Montpellier, France
fYear :
2013
fDate :
12-15 May 2013
Firstpage :
1
Lastpage :
4
Abstract :
3D power delivery networks are essential for delivering supply voltage to all tiers. PDNs on each tier are mesh networks that are bridged together using Through-Silicon-Vias (TSVs) to devise 3D PDNs. However, a host of vulnerabilities influence their resiliency and reliability such as power supply noise, long parasitic current paths, switching activities, high frequencies, and sensitivity to temperature variations. In this work, we perform a qualitative analysis to capture the impact of TSV-to-TSV substrate coupling (inductive and capacitive), power supply noise transfer among tiers, and different PDN topologies on 3D PDNs. Experiments show the criticality of these factors and their impact on power and thermal integrity of 3D PDNs.
Keywords :
frequency-domain analysis; integrated circuit reliability; three-dimensional integrated circuits; 3D PDN; 3D power delivery networks; TSV-to-TSV substrate coupling; frequency domain power integrity analysis; inductive-capacitive coupling; mesh networks; parasitic current path; power supply noise transfer; supply voltage delivery; switching activity; thermal integrity analysis; through-silicon-vias; Couplings; Integrated circuit modeling; Noise; Resonant frequency; Switching frequency; Through-silicon vias; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5678-7
Type :
conf
DOI :
10.1109/SaPIW.2013.6558328
Filename :
6558328
Link To Document :
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