DocumentCode :
618525
Title :
Homogenization technique for transmission lines with random permittivity profiles
Author :
Ochoa, Juan S. ; Cangellaris, Andreas C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2013
fDate :
12-15 May 2013
Firstpage :
1
Lastpage :
4
Abstract :
This paper proposes a homogenization model for transmission lines with nonuniformity manifested in the random permittivity profile of their surrounding medium. The statistics of the permittivity profile are defined in terms of a finite series of correlated random variables corresponding to discrete samples taken along the longitudinal dimension of the line. Principal Component Analysis is employed to reduce the dimensionality of the random space that characterizes the uncertainty of the structure. Next, Polynomial Chaos expansion is used to capture the dependencies of the resulting homogeneous effective permittivity with the reduced-order random parameters that define the variability. Such construction is performed efficiently with the use of a Sparse Grid integration technique. In particular, the statistics of the propagation time of a wave traveling in the uncertain medium are calculated with the proposed homogenization model and validated with Monte Carlo simulations.
Keywords :
Monte Carlo methods; permittivity; polynomials; principal component analysis; transmission lines; Monte Carlo simulations; correlated random variables; finite series; homogeneous effective permittivity; homogenization model; homogenization technique; line longitudinal dimension; polynomial chaos expansion; principal component analysis; propagation time statistics; random permittivity profiles; random space dimensionality reduction; reduced-order random parameters; sparse grid integration technique; surrounding medium; transmission lines; wave traveling; Atmospheric modeling; Computational modeling; Electromagnetics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5678-7
Type :
conf
DOI :
10.1109/SaPIW.2013.6558336
Filename :
6558336
Link To Document :
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