DocumentCode :
618533
Title :
Modeling and minimizing the inductance of bond wire interconnects
Author :
Ndip, Ivan ; Oz, Abdurrahman ; Guttowski, Stephan ; Reichl, Herbert ; Lang, K.-D. ; Henke, Heino
Author_Institution :
Fraunhofer IZM, Berlin, Germany
fYear :
2013
fDate :
12-15 May 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a novel analytical model for calculating the partial self-inductance of bond wires in dependent on bonding parameters such as loop height, distance between bonding positions and the thickness of the metallization on which the wire is bonded, is derived for the first time. An excellent correlation is obtained between inductances extracted using our proposed model and those extracted using Ansys Q3D, with a maximum deviation of approximately 1%. Furthermore, methods for minimizing the inductance of bond wires, based on the definitions of loop and partial inductances are discussed. Test bond wire structures are designed, fabricated and measured to quantify the implemented method.
Keywords :
integrated circuit design; integrated circuit metallisation; integrated circuit modelling; lead bonding; Ansys Q3D; bond wire interconnects; bonding parameter; bonding position; inductance minimization; inductance modeling; loop height; loop inductance; metallization thickness; partial self-inductance; test bond wire structure design; test bond wire structure fabrication; test bond wire structure measurement; Analytical models; Bonding; Inductance; Integrated circuit interconnections; Integrated circuit modeling; Solid modeling; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5678-7
Type :
conf
DOI :
10.1109/SaPIW.2013.6558344
Filename :
6558344
Link To Document :
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