Step response sensitivity of VLSI interconnects

Author

Wardzinska, Agnieszka ; Bandurski, Wojciech

Author_Institution

Poznan Univ. of Technol., Poznan, Poland

fYear

2013

fDate

12-15 May 2013

Firstpage

1

Lastpage

4

Abstract

In the paper sensitivity of the voltage step response of the system inverter-interconnect-inverter with respect to selected parameters is considered. The sensitivity coefficients for normalized parameters are given. These formulas correspond with sensitivity coefficients to interconnect RLC parameters and input and output parameters. The sensitivity is calculated directly from step response formula. The closed form formula for the output response allows to present closed form formulas the for sensitivity.

Keywords

RLC circuits; VLSI; integrated circuit interconnections; integrated circuit modelling; step response; VLSI Interconnects; interconnect RLC parameters; normalized parameter; sensitivity coefficient; step response formula; system inverter-interconnect-inverter; voltage step response sensitivity; Approximation methods; Integrated circuit interconnections; Integrated circuit modeling; Power transmission lines; Resistance; Scattering parameters; Sensitivity; RLC transmission line; VLSI interconnect; sensitivity; step response;

fLanguage

English

Publisher

ieee

Conference_Titel

Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on

Conference_Location

Paris

Print_ISBN

978-1-4673-5678-7

Type

conf

DOI

10.1109/SaPIW.2013.6558349

Filename

6558349