DocumentCode :
618628
Title :
RF-MEMS devices packaging by using quartz caps and epoxy polymer sealing rings
Author :
Giacomozzi, Flavio ; Mulloni, V. ; Colpo, Sabrina ; Faes, A. ; Sordo, Guido ; Girardi, Stefano
Author_Institution :
Fondazione Bruno Kessler (FBK), Trento, Italy
fYear :
2013
fDate :
16-18 April 2013
Firstpage :
1
Lastpage :
6
Abstract :
This work reports on RF MEMS chip capping to protect sensitive devices by quartz caps having a cavity to enclose MEMS devices and an epoxy dry film polymer as a sealing ring. The fabrication process for both die-to-die and wafer-to-wafer 0-level capping is presented. Good adhesion of caps to the substrate is demonstrated by shear tests, while RF measurements on CPW lines indicate a negligible insertion loss increase. Capping of both capacitive and ohmic switches is reported showing no loss of functionality but a modification of actuation voltage induced by thermal treatment.
Keywords :
coplanar waveguides; electronics packaging; microfabrication; microswitches; quartz; seals (stoppers); CPW lines; RF MEMS chip capping; RF measurement; RF-MEMS device packaging; actuation voltage modification; cap adhesion; capacitive switch; die-to-die capping; epoxy dry film polymer; epoxy polymer sealing rings; fabrication process; functionality loss; insertion loss; ohmic switch; quartz caps; sensitive devices; shear tests; thermal treatment; wafer-to-wafer 0-level capping; Cavity resonators; Coplanar waveguides; Films; Micromechanical devices; Polymers; Radio frequency; Substrates; RF MEMS; chip capping; dry film; epoxy polymer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2013 Symposium on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4673-4477-7
Type :
conf
Filename :
6559413
Link To Document :
بازگشت