Author :
Xiang He ; Fritz, Theodore A. ; Knepper, Ronald W. ; Mavretic, Anton
Abstract :
The design, fabrication, and test results of a multi-channel integrated readout circuit (MIROC) mixed-signal ASIC for low capacitance (<;10pF) solid state sensors arrays are presented in this publication. The chip, fabricated in IBM 0.18 μm 7WL SiGe BiCMOS technology and measuring 4 × 4 mm, contains nineteen analog amplifier channels with pulse-shaping and peak-and-hold detection, three on-chip 8-bit hybrid ADCs, each equipped with an 8-bit parallel-to-serial shift register, and digital control logic for routing any of the channels with a hit to any available ADC. As a highly integrated system requiring minimal external controls, the chip was designed with the intention of significantly reducing cost, volume, power, and mass of the readout system for related applications, and consequently should reduce the development cycle of new instruments. MIROC has a FWHM noise below 20keV. Each channel contains four configurable conversion gain levels, measured to be 3.73mV/fC, 8.59mV/fC, 13.89mV/fC and 21.59mV/fC. In case of silicon detectors, the chip is capable of studying energetic charged particles over the range from 100keV to 6MeV. Measured test results and key characteristics are presented in the paper.
Keywords :
BiCMOS analogue integrated circuits; BiCMOS digital integrated circuits; Ge-Si alloys; amplifiers; analogue-digital conversion; capacitive sensors; cost reduction; integrated circuit design; integrated circuit measurement; integrated circuit noise; integrated circuit testing; logic circuits; mixed analogue-digital integrated circuits; peak detectors; pulse shaping circuits; readout electronics; sensor arrays; shift registers; FWHM noise; IBM 7WL BiCMOS technology; MIROC; SiGe; analog amplifier channel; channel routing; cost reduction; digital control logic; electron volt energy 100 keV to 6 MeV; mixed-signal ASIC; multichannel integrated readout circuit chip; on-chip hybrid ADC; parallel-to-serial shift register; peak-and-hold detection; pulse-shaping detection; silicon detector; size 0.18 mum; small low capacitance solid state sensor array; word length 8 bit; Capacitance; Linearity; Logic gates; Noise; Semiconductor device measurement; Sensor arrays; ADC; Charge Sensitive Amplifier; Charged Particle Detector; Peak Tracking and Hold Circuit; Pulse Shaping and Measurements;
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2013 Symposium on
