DocumentCode :
618967
Title :
Influence of substrate surface roughness on the properties of a planar-type CO2 sensor using evaporated Li3PO4 film
Author :
Hairong Wang ; Peng Li ; Guoliang Sun ; Zhuangde Jiang
fYear :
2013
fDate :
7-10 April 2013
Firstpage :
385
Lastpage :
388
Abstract :
Planar-type potentiometric CO2 gas sensors using thermal evaporated Li3PO4 thin film as the solid electrolyte were fabricated. Al2O3 plates with rough and smooth surfaces were used as the substrates of the sensors. X-ray diffraction analysis, atomic force microscope and scanning electron microscope were used to characterize the Li3PO4 films. The sensing properties were investigated in the range of 500~5000 ppm CO2 concentrations at 480 °C. Both the rough substrate sensor (rsensor) and the smooth substrate sensor (s-sensor) showed a good Nernst behavior. The output EMF of s-sensor showed a more stable signal than the r-senor. Response and recovery times of the r-sensor were 40 s and 75 s, and for the s-sensor they were 35 s and 60 s. The ΔEMF/decade values obtained from the r-sensor and s-sensor were 45 mV/decade and 55 mV/decade, respectively. It can be found that the Nernst´s slop of the s-sensor was closer to the theoretically value. The results revealed that the substrate surface roughness may influence the characteristics of Li3PO4 film and the response properties of the sensors to CO2.
Keywords :
X-ray diffraction; atomic force microscopy; carbon compounds; gas sensors; lithium compounds; rough surfaces; scanning electron microscopy; solid electrolytes; surface roughness; thin film sensors; Al2O3; CO2; Li3PO4; Nernst slop; X-ray diffraction; atomic force microscopy; output EMF; planar-type potentiometric CO2 gas sensors; rough substrate sensor; scanning electron microscopy; sensing properties; smooth substrate sensor; solid electrolyte; substrate surface roughness; temperature 480 degC; thermal evaporated thin film; Electrodes; Films; Gas detectors; Rough surfaces; Solids; Substrates; Surface roughness; Li3PO4 film; gas sensor; roughness influence; sensor sensitivity; solid electrolyte film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
Type :
conf
DOI :
10.1109/NEMS.2013.6559756
Filename :
6559756
Link To Document :
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