DocumentCode :
619026
Title :
Comparative study of a high pressure sensor with rectangular diaphragm
Author :
Niu, Zheng ; Zhao, Y.L. ; Tian, Bailing ; Guo, F.F.
Author_Institution :
State Key Lab. for Manuf. Syst. Eng., Xi´an Jiaotong Univ., Xi´an, China
fYear :
2013
fDate :
7-10 April 2013
Firstpage :
661
Lastpage :
664
Abstract :
This paper describes a comparative study between two kinds of high pressure sensors with rectangular diaphragm structure. In order to prove results of the study, the stress distributions of the rectangular membrane structure sensors were presented in this article. The stress distribution of the piezoresistance on the membrane was analyzed by the Finite Element Method (FEM) utilizing the ANSYS software. The two kinds of rectangular membrane structure sensors were fabricated with consistent process. The results of the comparative analysis indicate that the improvements of the sensing unit structure can enhance the sensitivity of the high pressure sensor and extend the measurement range of the sensor. Meanwhile, the accuracy requirement from double-sided lithography alignment is relatively low, which could ensure the rate of yield.
Keywords :
finite element analysis; piezoresistance; pressure sensors; sensitivity; ANSYS software; FEM; comparative analysis; double-sided lithography alignment; finite element method; high pressure sensor; piezoresistance; rectangular diaphragm structure; rectangular membrane structure sensors; sensitivity; stress distributions; Fabrication; Finite element analysis; Piezoresistance; Sensitivity; Silicon; Strain; Stress; high pressure sensor; rectangular diaphram; sensitivity; stress distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
Type :
conf
DOI :
10.1109/NEMS.2013.6559816
Filename :
6559816
Link To Document :
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