DocumentCode
619045
Title
PDMS-CYTOP hybrid structure microwell array chip for total internal reflection fluorescence microscopy
Author
Nakahara, Akihito ; Shirasaki, Y. ; Mizuno, Jun ; Sekiguchi, Takeshi ; Ohara, O. ; Shoji, Shuji
Author_Institution
Major in Nano-Sci. & Nano-Eng, Waseda Univ., Tokyo, Japan
fYear
2013
fDate
7-10 April 2013
Firstpage
743
Lastpage
746
Abstract
A microwell arrry device with a hybrid structure of amorphous perfluoroplymer, CYTOPTM, and polydimethylsiloxane (PDMS) which is specialized in total internal reflection fluorescence (TIRE) microscopy was developed. Since the CYTOP layer, whose refractive index is as same as that of water, is sandwiched between PDMS and glass substrate, leakage of incident light is avoided. PDMS layer upon the CYTOP enables high aspect ratio structures and easy integration of microfluidic components. Since direct bonding of CYTOP and PDMS is difficult to achieve, a chemical bonding method using aminosilane coupling reagent and 3-Glycoidoxypropyltriethoxysilane was applied. The bond strength was about 0.74 MPa. 24 × 50 microwell array was fabricated and their optical properties was evaluated. Measured TIRE microscopy results shows no interfere with incident light under the conventionally used conditions.
Keywords
bonding processes; fluorescence; glass; light reflection; microfabrication; microfluidics; optical microscopy; optical variables measurement; polymers; refractive index; CYTOPTM; PDMS-CYTOP hybrid structure microwell array chip; TIRE microscopy measurement; aminosilane coupling reagent; amorphous perfluoroplymer; chemical bonding method; glass substrate; glycoidoxypropyltriethoxysilane; microfluidic component; polydimethylsiloxane; refractive index; total internal reflection fluorescence microscopy; Arrays; Bonding; Couplings; Fluorescence; Glass; Laser excitation; Microscopy; CYTOP; TIRF microscopy; microwell array;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location
Suzhou
Electronic_ISBN
978-1-4673-6351-8
Type
conf
DOI
10.1109/NEMS.2013.6559835
Filename
6559835
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