Title :
Contactless RF MEMS switch using PZT actuation
Author :
Giffney, Tim ; Miao Yu ; Aw, Kean C. ; Haixia Zhang
Author_Institution :
Dept. of Mech. Eng., Univ. of Auckland, Auckland, New Zealand
Abstract :
RF MEMS devices are competitive for handling high frequency microwave signals. In comparison to semiconductor devices, the performance of RF MEMS devices is highly linear, minimizing signal distortion. A contactless piezoelectric RF MEMS switch has been designed and simulated. Due to the use of a contactless design based on variable capacitance the reliability issues affecting contacting-type MEMS switches are avoided. The structure is piezoelectrically actuated using a sputtered lead zirconate titanate (PZT) layer. Finite element simulation has been conducted to optimize the structure. Electrical simulation predicts that, by achieving an on-off capacitance ratio greater than 10, isolation will exceed 15 dB over the frequency range from 4 to 15 GHz. Preliminary isolation measurements on fabricated devices without the actuating layer showed 26 dB isolation at 4 GHz, similar to that modeled, although isolation did not decrease by the modeled trend at high frequencies approaching 15 GHz.
Keywords :
distortion; finite element analysis; lead compounds; microswitches; microwave switches; piezoelectric actuators; reliability; PZT; PZT actuation; RF MEMS devices; contactless RF MEMS switch design; contactless piezoelectric RF MEMS switch; electrical simulation; finite element simulation; frequency 4 GHz to 15 GHz; high frequency microwave signals; on-off capacitance ratio; piezoelectric actuation; semiconductor devices; signal distortion minimization; sputtered lead zirconate titanate layer; variable capacitance; Contacts; Electrodes; Insertion loss; Microswitches; Performance evaluation; Radio frequency; Sputtering; PZT; RF MEMS; non-contact; piezoelectric MEMS switch;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
DOI :
10.1109/NEMS.2013.6559860