Title :
Indentation-induced two-way shape-memory effect in NiTi
Author :
Peter, Nicolas J. ; Frensemeier, Mareike ; Qin, Evean ; Frick, Carl P. ; Arzt, E. ; Schneider, Andreas S.
Author_Institution :
INM-Leibniz Inst. for New Mater., Saarbrücken, Germany
Abstract :
The indentation-induced shape-memory behavior in both an aged and a solutionized austenitic nickel-titanium (NiTi) alloy was investigated by Vickers indentation. The depth recovery ratio of the indents as well as the formation of protrusions on the surface after planarization was analyzed after the sample was heated above and cooled below the phase transformation temperature using a white light interferometer. For comparison a solutionized, fully austenitic sample was subjected to the same indentation parameters and temperature changes. The results show that indentation induces a one-way and two-way shape-memory effect in the aged material containing small fractions of martensite and precipitates. In contrast, the solutionized fully austenitic sample shows less pronounced one-way compared to the aged material and no two-way shape recovery. This phenomenon is discussed in terms of martensite stabilization by precipitates and dislocations.
Keywords :
Vickers hardness; ageing; dislocations; indentation; martensitic transformations; nickel alloys; planarisation; precipitation; shape memory effects; titanium alloys; NiTi; Vickers indentation; aged austenitic nickel-titanium alloy; aged material; dislocations; indent depth recovery ratio; indentation parameters; indentation-induced shape-memory behavior; indentation-induced two-way shape-memory effect; martensite fraction; martensite stabilization; one-way shape-memory effect; phase transformation temperature; planarization; precipitate fraction; protrusion formation; solutionized austenitic nickel-titanium alloy; temperature changes; white light interferometer; Aging; Cooling; Heating; Materials; Shape; Surface morphology; Temperature measurement; Indentation; Microstructure; NiTi; Shape-memory effect;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
DOI :
10.1109/NEMS.2013.6559921