• DocumentCode
    619477
  • Title

    Post-silicon conformance checking with virtual prototypes

  • Author

    Li Lei ; Fei Xie ; Kai Cong

  • Author_Institution
    Dept. of Comput. Sci., Portland State Univ., Portland, OR, USA
  • fYear
    2013
  • fDate
    May 29 2013-June 7 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Virtual prototypes are increasingly used in device/driver co-development and co-validation to enable early driver development and reduce product time-to-market. However, drivers developed over virtual prototypes often do not work readily on silicon devices, since silicon devices often do not conform to virtual prototypes. Therefore, it is important to detect the inconsistences between silicon devices and virtual prototypes. We present an approach to post-silicon conformance checking of a hardware device with its virtual prototype, i.e., a virtual device. The conformance between the silicon and virtual devices is defined over their interface states. This approach symbolically executes the virtual device with the same driver request sequence to the silicon device, and checks if the interface states of the silicon and virtual devices are consistent. Inconsistencies detected indicate potential errors in either the silicon device or the virtual device. We have evaluated our approach on three network adapters and their virtual devices, and found 15 inconsistencies exposing 15 real bugs in total from the silicon and virtual devices. The results demonstrate that our approach is useful and efficient in facilitating device/driver covalidation at the post-silicon stage.
  • Keywords
    time to market; virtual prototyping; device/driver codevelopment; device/driver covalidation; post-silicon conformance checking; time-to-market; virtual prototypes; Computer bugs; Hardware; Interface states; Prototypes; Registers; Silicon; Silicon devices; Post-silicon validation; conformance checking; virtual prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0738-100X
  • Type

    conf

  • Filename
    6560622