• DocumentCode
    619478
  • Title

    On testing timing-speculative circuits

  • Author

    Feng Yuan ; Yannan Liu ; Jone, Wen-Ben ; Qiang Xu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
  • fYear
    2013
  • fDate
    May 29 2013-June 7 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    By allowing the occurrence of infrequent timing errors and correcting them online, circuit-level timing speculation is one of the most promising variation-tolerant design techniques. How to effectively test timing-speculative circuits, however, has not been addressed in the literature. This is a challenging problem because conventional scan techniques cannot provide sufficient controllability and observability for such circuits. In this paper, we propose novel techniques to achieve high fault coverage for timing-speculative circuits without incurring high design-for-testability cost. Experimental results on various benchmark circuits demonstrate the effectiveness of the proposed solution.
  • Keywords
    design for testability; integrated circuit testing; timing circuits; circuit-level timing speculation; controllability; conventional scan techniques; design-for-testability cost; infrequent timing errors; observability; timing-speculative circuits testing; variation-tolerant design techniques; Benchmark testing; Circuit faults; Clocks; Delays; Latches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0738-100X
  • Type

    conf

  • Filename
    6560623