Title :
Underpowering NAND flash: Profits and perils
Author :
Hung-Wei Tseng ; Grupp, Laura M. ; Swanson, Stephen
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of California, San Diego, La Jolla, CA, USA
fDate :
May 29 2013-June 7 2013
Abstract :
MLC Flash memory is getting more popular in computer systems ranging from sensor networks and embedded systems to large-scale server systems. However, MLC flash has many reliability concerns, including the potential for corruption due to supply voltage fluctuations. This paper characterizes MLC flash when the chip is underpowered (i.e., power fading and voltage droops). We demonstrate that underpowering flash can cause serious errors, but also help saving up to 45% of operation energy without incurring failure.
Keywords :
NAND circuits; flash memories; MLC flash memory; computer systems; embedded systems; large-scale server systems; multilevel cell; perils; power fading; profits; sensor networks; underpowering NAND flash; voltage droops; Abstracts; Face; Solids;
Conference_Titel :
Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
Conference_Location :
Austin, TX
