DocumentCode
620190
Title
Research on test technology of RFID system
Author
Zhen-jun Guo
Author_Institution
Inst. of Inf. & Technol., Guilin Univ. of Electron. Technol., Guilin, China
fYear
2013
fDate
25-27 May 2013
Firstpage
2793
Lastpage
2796
Abstract
On the basis of the RFID testing standards theoretical analysis, it designs a RFID system test platform based on the embedded Linux. It carries on the design development by hardware system´s design of test platform, the software development platform construction and the application software system´s design. It designs the application software system of test platform by Qt, and gives the application software test process, it electively assess the RFID system performance. The article analyzes the influence to the overall system performance, and carries on separately the simulation test to the RFID system from encoding method, CRC verification code and negative carrier modulation depth.
Keywords
Linux; formal verification; radiofrequency identification; software engineering; telecommunication computing; CRC verification code; RFID system test platform; RFID testing standards theoretical analysis; embedded Linux; hardware system design; negative carrier modulation depth; software development platform construction; software system design application; test technology; Encoding; IEC standards; Modulation; Performance evaluation; Radiofrequency identification; Testing; Performance test; RFID test platform; Uniform test;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Decision Conference (CCDC), 2013 25th Chinese
Conference_Location
Guiyang
Print_ISBN
978-1-4673-5533-9
Type
conf
DOI
10.1109/CCDC.2013.6561419
Filename
6561419
Link To Document