Title : 
A new model for software defect prediction using Particle Swarm Optimization and support vector machine
         
        
            Author : 
He Can ; Xing Jianchun ; Zhu Ruide ; Li Juelong ; Yang Qiliang ; Xie Liqiang
         
        
            Author_Institution : 
PLA Univ. of Sci. & Technol., Nanjing, China
         
        
        
        
        
        
            Abstract : 
Software defect prediction could improve the reliability of software and reduce development costs. Traditional prediction models usually have a lower prediction accuracy. In order to solve this problem, a new model for software defect prediction using Particle Swarm Optimization (PSO) and Support Vector Machine (SVM) named P-SVM model is proposed in this paper, which takes advantage of non-linear computing capability of SVM and parameters optimization capability of PSO. Firstly, P-SVM model uses PSO algorithm to calculate the best parameters of SVM, and then it adopts the optimized SVM model to predict software defect. P-SVM model and other three different prediction models are used to predict the software defects in JM1 data set as an experiment, the results show that P-SVM model has a higher prediction accuracy than BP Neural Network model, SVM model, GA-SVM model.
         
        
            Keywords : 
backpropagation; neural nets; particle swarm optimisation; software reliability; support vector machines; BP Neural Network model; GA-SVM model; P-SVM model; PSO; nonlinear computing; particle swarm optimization; software defect prediction; software reliability; support vector machine; Accuracy; Data models; Optimization; Prediction algorithms; Predictive models; Software; Support vector machines; Particle Swarm Optimization; Support Vector Machine; parameters optimization; software defect prediction;
         
        
        
        
            Conference_Titel : 
Control and Decision Conference (CCDC), 2013 25th Chinese
         
        
            Conference_Location : 
Guiyang
         
        
            Print_ISBN : 
978-1-4673-5533-9
         
        
        
            DOI : 
10.1109/CCDC.2013.6561670