• DocumentCode
    620825
  • Title

    A 586 MHz microcontroller compensated MEMS oscillator based on ovenized aluminum nitride contour-mode resonators

  • Author

    Tazzoli, Augusto ; Kuo, N.-K. ; Rinaldi, Matteo ; Pak, Hui-Nam ; Fry, D. ; Bail, D. ; Stevens, Daniel ; Piazza, Gianluca

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2012
  • fDate
    7-10 Oct. 2012
  • Firstpage
    1055
  • Lastpage
    1058
  • Abstract
    This work reports on the demonstration of a Microcontroller Compensated MEMS Oscillator based on a UHF ovenized AlN CMR, which shows temperature stability, short-term stability, and acceleration sensitivity comparable to SAW-based oscillators. Over the temperature range -25 ÷ 85°C, the demonstrated 586 MHz oscillator exhibits a temperature stability of 1.7 ppm, stable phase noise values better than -91 dBc/Hz at 1 kHz, and -160 dBc/Hz at 40 MHz offsets, and acceleration sensitivity values better than 30 ppb/g. The design of the integrated heater all-around the top RF electrodes and the new digital temperature controller allowed to simplify the fabrication process compared to our previous demonstration, and to virtually compensate frequency shifts of any origin, i.e. from both the MEMS and the electronic circuitry.
  • Keywords
    microcontrollers; micromechanical resonators; oscillators; surface acoustic wave oscillators; AlN; RF electrodes; SAW-based oscillators; acceleration sensitivity; contour-mode resonators; digital temperature controller; electronic circuitry; frequency 1 kHz; frequency 40 MHz; frequency 586 MHz; short-term stability; temperature -25 C to 85 C; temperature stability; Electrodes; Heating; III-V semiconductor materials; Micromechanical devices; Oscillators; Resonant frequency; Temperature sensors; AlN contour mode resonator; MEMS; Oscillator; Temperature compensation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2012 IEEE International
  • Conference_Location
    Dresden
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-4561-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2012.0264
  • Filename
    6562210