Title :
Liquid-Phase Electroepitaxy of GaN at atmospheric pressure using ammonia and Ga-Ge solution
Author :
Kanbayashi, D. ; Hishida, T. ; Tomita, Masaru ; Takakura, Hiroki ; Maruyama, Tetsuhiro ; Naritsuka, Shigeya
Author_Institution :
Mater. Sci. & Eng., Meijo Univ., Nagoya, Japan
Abstract :
Liquid-Phase Electroepitaxy of c-plane GaN was tried to perform using NH3 and a mixed solution of Ga and Ge. Consequently, GaN layer was successfully grown at the atmospheric pressure. The thickness of the grown layer was found to monotonously increase with the current. The thickness of the layer grown with the current of 4 A was more than twice of that of the conventional LPE. The growth thickness shows almost no change by the change of the thickness of the solution. This result strongly suggests the growth was driven mainly by the electromigration, which was caused by the current flow through the solution.
Keywords :
III-V semiconductors; electromigration; gallium compounds; liquid phase deposition; semiconductor epitaxial layers; semiconductor growth; wide band gap semiconductors; GaN; ammonia; conventional LPE; current flow; electromigration; gallium-germanium solution; growth thickness; liquid-phase electroepitaxy; pressure 1 atm; Electrodes; Electromigration; Force; Gallium nitride; Nitrogen; Substrates; Atmospheric Pressure; Electromigration; GaN; Growth rate enhancement; Liquid-Phase Electroepitaxy;
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
Conference_Location :
Kobe
Print_ISBN :
978-1-4673-6130-9
Electronic_ISBN :
1092-8669
DOI :
10.1109/ICIPRM.2013.6562584