DocumentCode :
621015
Title :
Liquid-Phase Electroepitaxy of GaN at atmospheric pressure using ammonia and Ga-Ge solution
Author :
Kanbayashi, D. ; Hishida, T. ; Tomita, Masaru ; Takakura, Hiroki ; Maruyama, Tetsuhiro ; Naritsuka, Shigeya
Author_Institution :
Mater. Sci. & Eng., Meijo Univ., Nagoya, Japan
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
1
Lastpage :
2
Abstract :
Liquid-Phase Electroepitaxy of c-plane GaN was tried to perform using NH3 and a mixed solution of Ga and Ge. Consequently, GaN layer was successfully grown at the atmospheric pressure. The thickness of the grown layer was found to monotonously increase with the current. The thickness of the layer grown with the current of 4 A was more than twice of that of the conventional LPE. The growth thickness shows almost no change by the change of the thickness of the solution. This result strongly suggests the growth was driven mainly by the electromigration, which was caused by the current flow through the solution.
Keywords :
III-V semiconductors; electromigration; gallium compounds; liquid phase deposition; semiconductor epitaxial layers; semiconductor growth; wide band gap semiconductors; GaN; ammonia; conventional LPE; current flow; electromigration; gallium-germanium solution; growth thickness; liquid-phase electroepitaxy; pressure 1 atm; Electrodes; Electromigration; Force; Gallium nitride; Nitrogen; Substrates; Atmospheric Pressure; Electromigration; GaN; Growth rate enhancement; Liquid-Phase Electroepitaxy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
Conference_Location :
Kobe
ISSN :
1092-8669
Print_ISBN :
978-1-4673-6130-9
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2013.6562584
Filename :
6562584
Link To Document :
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