Abstract :
The following topics are dealt with: integrated circuit simulation, diagnosis and variability; software, hardware and architecture fault-tolerance; design verification and validation; analog mixed signal test; software and hardware testing; radiation and electromagnetic interference;design for testability; and memory testing and repair.
Keywords :
design for testability; electromagnetic interference; fault diagnosis; hardware-software codesign; integrated circuit design; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; radiation hardening (electronics); semiconductor storage; analog mixed signal test; architecture fault tolerance; design for testability; design validation; design verification; electromagnetic interference; hardware testing; integrated circuit diagnosis; integrated circuit simulation; integrated circuit variability; memory repair; memory testing; radiation interference; software testing;
Conference_Titel :
Test Workshop (LATW), 2013 14th Latin American
Conference_Location :
Cordoba
Print_ISBN :
978-1-4799-0595-9
DOI :
10.1109/LATW.2013.6562655
