Title :
Diagnostic modeling of digital systems with low- and high-level decision diagrams
Author_Institution :
Computer Engineering Department, Tallinn University of Technology, Estonia
Abstract :
The complexity of digital systems is constantly growing. This has resulted in an increasing trend in design errors and manufacturing faults in modern VLSI systems. As the result, verification and test will continue to dominate as crucial factors in time-to-market, reliability, and cost of VLSI systems.
Keywords :
Hardware design languages;
Conference_Titel :
Test Workshop (LATW), 2013 14th Latin American
Conference_Location :
Cordoba, Argentina
Print_ISBN :
978-1-4799-0595-9
DOI :
10.1109/LATW.2013.6562656
