Title :
Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs
Author :
Ben Dhia, Arwa ; Naviner, L. ; Matherat, Philippe
Author_Institution :
Inst. TELECOM, TELECOM ParisTech., Paris, France
Abstract :
This paper first introduces three new architectures of a voter for a Butterfly CLB in an SRAM-based FPGA. Taking into account area and delay constraints, an optimized voter architecture is picked up for the Butterfly design. Another version for the latter is also proposed in order to reduce the area overhead. Afterward, we synthesize different CLB fabless architectures in STM 65nm CMOS technology and evaluate their fault tolerance and reliability, so as to obtain an overview of the current state of the art. Finally, we compare the CLB architectures with respect to the conventional one by defining a metric expressing the tradeoff between the fault tolerance gain, the performance degradation and the cost penalties including area, power and SRAM memory.
Keywords :
CMOS integrated circuits; SRAM chips; fault tolerance; field programmable gate arrays; integrated circuit reliability; SRAM memory; SRAM-based FPGA; STM CMOS technology; butterfly CLB; configurable logic block; delay constraints; fault tolerance gain; fault-tolerant fabless CLB; optimized voter architecture; reliability; size 65 nm; Computer architecture; Random access memory; Reliability; Switches; CLB; Look-up Table (LUT); SRAM-based FPGA; fault tolerance; hardening techniques; logical masking; reliability;
Conference_Titel :
Test Workshop (LATW), 2013 14th Latin American
Conference_Location :
Cordoba
Print_ISBN :
978-1-4799-0595-9
DOI :
10.1109/LATW.2013.6562661