DocumentCode :
621091
Title :
Assessment of diagnostic test for automated bug localization
Author :
Tihhomirov, Valentin ; Tsepurov, Anton ; Jenihhin, M. ; Raik, Jaan ; Ubar, Raimund
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
fYear :
2013
fDate :
3-5 April 2013
Firstpage :
1
Lastpage :
6
Abstract :
Statistical simulation based design error debug approaches strongly rely on quality of the diagnostic test. At the same time there exists no dedicated technique to perform its quality assessment and engineers are forced to rely on subjective figures such as verification test quality metrics or just the size of the diagnostic test. This paper has proposed two new approaches for assessing diagnostic capability of diagnostic tests for automated bug localization. The first approach relies on probabilistic simulation of diagnostic experiments. The second assessment method is based on calculating Hamming distances of the individual sub-tests in the diagnostic test set. The methods are computationally cheap and they provide for a measure of confidence in the localization results and allow estimating impact of the diagnostic test enhancement. The approach is implemented as a part of an open-source hardware design and debugging framework zamiaCAD. Experimental results with an industrial processor design and a set of documented bugs demonstrate feasibility and effectiveness of the proposed approach.
Keywords :
program debugging; program testing; public domain software; software quality; statistical analysis; Hamming distances; automated bug localization; debugging framework; diagnostic capability; diagnostic experiments; diagnostic test enhancement; diagnostic test quality; diagnostic test set; diagnostic tests; documented bugs; industrial processor design; open-source hardware design; probabilistic simulation; quality assessment; second assessment method; statistical simulation based design error debug approaches; verification test quality metrics; zamiaCAD; Accuracy; Computer bugs; Debugging; Hamming distance; Hardware; Measurement; Quality assessment; debug; design error localization; diagnostic test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Workshop (LATW), 2013 14th Latin American
Conference_Location :
Cordoba
Print_ISBN :
978-1-4799-0595-9
Type :
conf
DOI :
10.1109/LATW.2013.6562665
Filename :
6562665
Link To Document :
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