• DocumentCode
    621337
  • Title

    Approach on Electrostatic Discharge protection structures based on Transient Voltage Suppressor diodes

  • Author

    Bicleanu, Dumitru-Paul ; Nicuta, Ana-Maria

  • Author_Institution
    Fac. of Electr. Eng., Gheorghe Asachi Tech. Univ. of Iasi, Iasi, Romania
  • fYear
    2013
  • fDate
    23-25 May 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The authors aim to demonstrate the benefits of using the Transient Voltage Suppressor diodes to enhance the immunity of MOSFET Integrated Circuits versus Electrostatic Discharge effects. There were used Transient Voltage Suppressor diodes as protection elements, with passive elements for signal filtering and protection against higher current magnitude. For biasing the protection structure it was used a PMOS/NMOS tandem with filtering passive elements.
  • Keywords
    MOSFET; electrostatic discharge; semiconductor diodes; MOSFET integrated circuits; PMOS-NMOS tandem; current magnitude; electrostatic discharge protection structures; passive elements; protection elements; signal filtering; transient voltage suppressor diodes; Clamps; Electrostatic discharges; Operational amplifiers; Rails; Resistors; Semiconductor diodes; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Topics in Electrical Engineering (ATEE), 2013 8th International Symposium on
  • Conference_Location
    Bucharest
  • Print_ISBN
    978-1-4673-5979-5
  • Type

    conf

  • DOI
    10.1109/ATEE.2013.6563381
  • Filename
    6563381